Freescale Semiconductor /MKW40Z4 /XCVR /ADC_TEST_CTRL

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Interpret as ADC_TEST_CTRL

31 2827 2423 2019 1615 1211 87 43 0 0 0 0 0 0 0 0 00 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 (0)ADC_ATST_SEL 0ADC_DIG_REG_ATST_SEL 0ADC_ANA_REG_ATST_SEL 0 (000)DCOC_ALPHA_RADIUS_GS_IDX 0 (ADC_SPARE3)ADC_SPARE3

DCOC_ALPHA_RADIUS_GS_IDX=000, ADC_ATST_SEL=0

Description

ADC Test Control

Fields

ADC_ATST_SEL

ADC Analog Test Selection

0 (0): Inject 5uA refrence current on ATST0 ,Inject 0.6V reference voltage on ATST1

1 (1): Monitor Flash refrence currents on ATST3

2 (10): Monitor DAC refrence current on ATST0,Monitor mirrored reference current at ATST1,Monitor operational amplifiers reference current at ATST2, Monitor buffered 0.6V reference voltage used for opamp1 common mode at ATST3

3 (11): Monitored buffered 0.6V reference voltrage used for opamp2 common mode at ATST0 monitor buffered 0.6V reference voltage used for opam3 comon mode at ATST2. However opamp3 does not exisit in this silicon but there is still a buffered reference available.

ADC_DIG_REG_ATST_SEL

ADC_DIG_REG_ATST_SEL

ADC_ANA_REG_ATST_SEL

ADC_ANA_REG_ATST_SEL

DCOC_ALPHA_RADIUS_GS_IDX

Alpha-R Scaling

0 (000): 1

1 (001): 1/2

2 (010): 1/4

3 (011): 1/8

4 (100): 1/16

5 (101): 1/32

6 (110): 1/64

ADC_SPARE3

ADC_SPARE3

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